Get CT-AI_(v1.0)_World Dumps : Verified ISTQB Certified Tester AI Testing (v 1.0)

?Coverage for Neuron Activation Values:Sign change coverage is used to ensure that test cases cause each neuron to achieve both positive and negative activation values. This type of coverage ensures that the neurons are thoroughly tested under different activation states.

?Reference:ISTQB_CT-AI_Syllabus_v1.0, Section 6.2 Coverage Measures for Neural Networks, which details different types of coverage measures, including sign change coverage??.

?Labelling Approaches:Among the options provided, pre-labeled datasets require the least time and effort because the data has already been labeled, eliminating the need for further manual or automated labeling efforts.

?Reference:ISTQB_CT-AI_Syllabus_v1.0, Section 4.5 Data Labelling for Supervised Learning, which discusses various approaches to data labeling, including pre-labeled datasets, and their associated time and effort requirements??.

?AI-Based Autonomous Functions:An AI-based autonomous system is one that can respond to its environment without human intervention. The other options either involve human decisions or do not use AI at all.

?Reference:ISTQB_CT-AI_Syllabus_v1.0, Sections on Autonomy and Testing Autonomous AI-Based Systems????.

The question refers to a problem where data used for an object detection ML system was labelled incorrectly. This issue is most closely related to "accuracy issues." Here's a detailed explanation:

Accuracy Issues: The primary goal of labeling data in machine learning is to ensure that the model can accurately learn and make predictions based on the given labels. Incorrectly labeled data directly impacts the model's accuracy, leading to poor performance because the model learns incorrect patterns.

Why Not Other Options:

Security Issues: This pertains to data breaches or unauthorized access, which is not relevant to the problem of incorrect data labeling.

Privacy Issues: This concerns the protection of personal data and is not related to the accuracy of data labeling.

Bias Issues: While bias in data can affect model performance, it specifically refers to systematic errors or prejudices in the data rather than outright incorrect labeling.

References:This explanation is consistent with the concepts covered in the ISTQB CT-AI syllabus under dataset quality issues and their impact on machine learning models??.

Defect prediction models aim to identify parts of the software that are likely to contain defects by analyzing historical data and code quality metrics. The primary goal is to use this predictive information to allocate testing and maintenance resources effectively. Let's break down why option D is the correct choice:

Understanding Classification Models:

Classification models are a type of supervised learning algorithm used to categorize or classify data into predefined classes or labels. In the context of defect prediction, the classification model would classify parts of the code as either "defective" or "non-defective" based on the input features.

Input Data - Code Quality Metrics:

The input data for these classification models typically includes various code quality metrics such as cyclomatic complexity, lines of code, number of methods, depth of inheritance, coupling between objects, etc. These metrics help the model learn patterns associated with defects.

Historical Data:

Historical versions of the code along with their defect records provide the labeled data needed for training the classification model. By analyzing this historical data, the model can learn which metrics are indicative of defects.

Why Option D is Correct:

Option D specifies using a classification model to predict the presence of defects by using code quality metrics as input data. This accurately describes the process of defect prediction using historical bug data and quality metrics.

Eliminating Other Options:

A. Identifying the relationship between developers and the modules developed by them: This does not directly involve predicting defects based on code quality metrics and historical data.

B. Search of similar code based on natural language processing: While useful for other purposes, this method does not describe defect prediction using classification models and code metrics.

C. Clustering of similar code modules to predict based on similarity: Clustering is an unsupervised learning technique and does not directly align with the supervised learning approach typically used in defect prediction models.

References:

ISTQB CT-AI Syllabus, Section 9.5, Metamorphic Testing (MT), describes various testing techniques including classification models for defect prediction.

"Using AI for Defect Prediction" (ISTQB CT-AI Syllabus, Section 11.5.1).